ISDA

3DAM

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.5	277	0.2M (NH4)H2PO4, 50% MPD 0.1M Tris pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Unit Cell:

a: 126.535 Å b: 126.535 Å c: 164.046 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 4 2 2

Crystal Properties:

Matthew's Coefficient: 3.07 Solvent Content: 59.89

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MIR	THROUGHOUT	2.40	28.38	24762	2459	93.8	0.198	0.243	42.9

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.4	50.0	98.6	?	0.8	15.2	98.6	26491	26120	?	?	31.6

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.4	2.49	100	?	?	2.4	100	2603

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU RUH3R	1.5418	?	?

Software