X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 282 20% PEG 3350, 0.2M potassium nitrate, 0.1mM CaCl2, 0.1mM pyrophosphate, pH 7.4, VAPOR DIFFUSION, SITTING DROP, temperature 282K
Unit Cell:
a: 119.880 Å b: 119.880 Å c: 96.220 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42 21 2
Crystal Properties:
Matthew's Coefficient: 2.84 Solvent Content: 56.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 2.50 19.98 22199 1183 94.23 0.23802 0.29468 29.076
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 30 93.2 0.175 ? 8 ? ? 23282 ? 2.7 32
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.5 2.65 98 ? ? 2.7 6.3 3858
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.97 SLS X10SA
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
MAR345 data collection .
XDS data reduction .
XSCALE data scaling .
SHARP phasing .