X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 281 19% polyethylene glycol 400, 0.1M Tris HCl pH 7.6, 0.1M NaCl, 6% v/v 1,6-hexanediol, 3% v/v 1,4-butanediol or 3% v/v 1,3-propanediol, VAPOR DIFFUSION, HANGING DROP, temperature 281K
Unit Cell:
a: 90.477 Å b: 90.644 Å c: 184.395 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 3.15 Solvent Content: 61.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO FREE R 2.00 10.00 79673 4174 78.0 ? 0.193 37.2
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 52.56 82.9 ? 0.061 8.3 3.7 84751 84751 ? 3.0 26.15
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.11 82.6 ? 0.494 1.5 3.7 12232
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 170.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-3 0.931 ESRF ID14-3
Software
Software Name Purpose Version
SHELX model building .
SHELXL-97 refinement .
MxCuBE data collection .
MOSFLM data reduction .
SCALA data scaling .
AMoRE phasing .