X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 0.1 M citric acid, 2.8 M (NH4)2SO4, 1% (v/v) glycerol, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 57.400 Å b: 57.400 Å c: 107.490 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43
Crystal Properties:
Matthew's Coefficient: 2.62 Solvent Content: 52.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.907 19.62 25554 1277 99.07 0.18279 0.21601 16.338
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 95.2 ? 0.04 40 8.2 ? 27084 0 0 29.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 2.0 70.4 ? 0.11 14.2 5.2 5392
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9794 SLS X10SA
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
MAR345 data collection SOFTWARE
XDS data reduction .
XSCALE data scaling .
SHELX phasing .
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