X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.60 293.0 PH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K, pH 6.60
Unit Cell:
a: 116.184 Å b: 83.061 Å c: 96.705 Å α: 90.00° β: 115.09° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.47 Solvent Content: 49.36
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD FREE R 1.50 10.00 121158 6384 91.5 0.131 0.191 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 50.000 96.4 0.05700 ? 19.1900 3.600 ? 127359 ? 1.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.55 75.7 ? ? 1.920 1.80 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.100 NSLS X29A
Software
Software Name Purpose Version
HKL2Map model building .
SOLVE phasing .
RESOLVE model building .
CCP4 model building .
ARP/wARP model building 2 SOFTWARE USED: SHELX FOR FINAL REFINEMENT
SHELXL-97 refinement .
ADSC data collection Quantum
HKL-2000 data reduction .
HKL-2000 data scaling .
HKL2Map phasing .
RESOLVE phasing .
CCP4 phasing .
SHELXL-97 phasing .
Feedback Form
Name
Email
Institute
Feedback