X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.15 292 100 mM MES pH 6.15, 18% PEG 3350, 100 mM KSCN, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 58.622 Å b: 84.480 Å c: 75.397 Å α: 90.00° β: 102.87° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.70 19.92 28000 2568 72.5 0.231 0.271 47.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.70 30.0 89.7 0.094 0.076 11.17 2.3 38850 38850 0 0 20.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.70 2.80 81.7 ? 0.281 1.76 2.0 3545
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97777 NSLS X4C
Software
Software Name Purpose Version
CNS refinement 1.2
ADSC data collection Quantum
DENZO data reduction .
SCALEPACK data scaling .
SnB phasing .
RESOLVE phasing .