X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.4 293 100 mM Tris/HCl, 16-18% PEG 3350, 200 mM sodium tartrate, pH 6.4, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 50.816 Å b: 89.479 Å c: 66.322 Å α: 90.000° β: 112.550° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.18 Solvent Content: 43.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.600 50.572 71888 3630 99.610 0.188 0.227 17.895
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.600 61.20 99.600 0.071 0.071 5.900 3.800 ? 71913 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.69 100.00 ? 0.398 1.9 3.70 10555
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9 SLS X06SA
Software
Software Name Purpose Version
SCALA data scaling 3.2.25
REFMAC refinement 5.2.0019
PDB_EXTRACT data extraction 3.005
MOSFLM data reduction .
SHELXS phasing .
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