X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 2.0 M Ammonium sulfate, 0.2 M Sodium acetate, 0.1 M Hepes pH 7.5, 5% MPD, 15% Glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 97.455 Å b: 97.455 Å c: 97.455 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 3
Crystal Properties:
Matthew's Coefficient: 2.46 Solvent Content: 50.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.000 29.38 21155 1089 99.920 0.195 0.248 28.321
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 50.0 99.8 0.0507 0.0466 13.5 11.700 21155 21155 0 0 30.77
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 99.90 ? 0.4274 2.09 9.00 2073
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.97900 NSLS X25
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
PHASER phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 3.005
ADSC data collection Quantum
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