X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.6 277 38-40% MPD, 0.3M KCl, 0.1M MES.KOH, pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 126.471 Å b: 127.075 Å c: 152.024 Å α: 95.420° β: 105.920° γ: 101.800°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.41 Solvent Content: 63.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 5.493 123.091 28397 ? ? ? ? 231.620
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
5.493 123.091 99.100 0.082 ? 12.9 7.900 28397 28397 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 5.493 5.780 98.30 ? ? 1.1 7.80 4031
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.2557,1.2511 SLS X06SA
Software
Software Name Purpose Version
SCALA data scaling 3.3.4
PDB_EXTRACT data extraction 3.005
MOSFLM data reduction .
SHARP phasing .
O model building .