X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 2M NaCl, 0.1M Bis-Tris pH5.5, 2.5% Polyacrylic acid 5100 sodium salt, 0.1 M Sodium Nitrate, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 154.190 Å b: 154.190 Å c: 85.870 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 3.90 Solvent Content: 68.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.80 48.76 24588 1318 99.54 0.25190 0.27654 68.787
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 51.37 98.7 0.071 0.074 25.3 11 ? 26107 1.0 1.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.80 2.95 99.6 ? 0.380 5.5 11.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 95 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BSRF BEAMLINE 3W1A 0.9800 BSRF 3W1A
Software
Software Name Purpose Version
SCALA data processing .
SOLVE phasing .
CNS refinement .
PDB_EXTRACT data extraction 3.005
ADSC data collection Quantum
MOSFLM data reduction .
SCALA data scaling .
REFMAC refinement 5.2.0019