3CT6

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 2.8 289 200 mM NaNO3, 20 % PEG 3350, pH 2.8, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 30.600 Å b: 62.400 Å c: 69.700 Å α: 90.00° β: 99.60° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO FREE R 1.10 40.00 ? 1987 93.0 0.1468 0.1769 17.891
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 40.00 93.00 0.069 ? 17.41 2.489 ? 97245 ? ? 12.936
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.100 1.136 90.770 ? ? 4.400 2.218 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X12 ? EMBL/DESY, HAMBURG X12
Software
Software Name Purpose Version
XSCALE data scaling .
SOLVE phasing 2.08
RESOLVE phasing 2.08
SHELX refinement .
PDB_EXTRACT data extraction 3.005
XDS data reduction .
SHELX phasing .
SHELXL-97 refinement .