X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 291 2 M NaCl, 100 mM Tris, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 157.650 Å b: 164.740 Å c: 597.300 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 2 2 2
Crystal Properties:
Matthew's Coefficient: 4.16 Solvent Content: 74.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION Difference fourier ? 3.00 49.43 77295 3890 99.2 0.219 0.244 83.08
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 49.4 99.6 0.145 ? 9.79 10.46 ? 77295 0 -3 62.29
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.0 3.2 98.6 ? ? 2.15 5.13 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9792 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement (phenix.refine)
XDS data reduction .
XSCALE data scaling .
PHENIX phasing .