X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 289 2.0M Ammonium sulfate, 0.1M Citrate pH 5.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 124.140 Å b: 124.140 Å c: 140.186 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 4.42 Solvent Content: 72.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.69 35.37 17960 915 98.42 0.20154 0.22748 54.70
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.69 35.370 99.5 0.115 0.115 7.2 11.900 18036 18036 ? -3.000 55.32
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.69 2.80 94.2 ? 0.835 2.600 12.60 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.9793 APS 19-BM
Software
Software Name Purpose Version
HKL-3000 phasing .
MLPHARE phasing .
DM model building .
SHELXD phasing .
RESOLVE model building .
Coot model building .
REFMAC refinement 5.2.0019
SBC-Collect data collection .
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
DM phasing .
RESOLVE phasing .
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