X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.5 294 100mM Citric acid pH 3.5, 25% PEG 3350, VAPOR DIFFUSION, temperature 294K
Unit Cell:
a: 57.728 Å b: 69.619 Å c: 72.505 Å α: 90.000° β: 91.090° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.82 Solvent Content: 32.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.269 20.000 145624 7331 96.260 0.151 0.172 14.120
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.269 72.548 95.500 0.095 0.095 15.1 7.600 145644 145644 0 0 9.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.269 1.330 88.50 ? 0.439 3.3 6.90 19656
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.97958 APS 31-ID
Software
Software Name Purpose Version
SCALA data scaling .
REFMAC refinement .
PDB_EXTRACT data extraction 3.004
MAR345 data collection CCD
MOSFLM data reduction .
SHELXCD phasing .
SHELXE model building .