X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.2 294 100mM Bis-Tris pH 5.2, 29% PEG 3350, 200mM Ammonium sulfate, 10% Glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 72.023 Å b: 72.023 Å c: 141.069 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.52 20.00 4822 133 99.78 0.21289 0.27187 48.940
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.52 50.000 99.6 0.138 ? 3.7000 6.400 ? 4985 ? -5.000 52.388
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.52 2.61 97.2 ? ? 1.200 5.30 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 77.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.9796 APS 31-ID
Software
Software Name Purpose Version
SHELX model building .
REFMAC refinement 5.3.0034
MAR345 data collection CCD
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELXD phasing .
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