X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.45 293 1.45M ammonium sulphate, 0.1M Na-cacodylate, 0.1% (v/v) Anapoe X-405, pH 5.45, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 61.482 Å b: 92.861 Å c: 98.825 Å α: 110.77° β: 90.00° γ: 109.36°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.05 Solvent Content: 59.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 2.000 20.000 107602 5529 83.400 ? 0.282 46.560
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 20.0 83.2 ? 3.2 16.2 1.9 ? 129807 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 46.9 ? 27.3 2.0 1.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.95373 BESSY 14.1
Software
Software Name Purpose Version
CNS refinement .
PDB_EXTRACT data extraction 3.004
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .