X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 277 0.1 M Potassium phosphate, 0.04 M Tris-HCl pH 8.0, 0.06 M Tris-HCl pH 9.0, 34% PEG 4000, 2 mM SAM, 5 mM BME, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 44.080 Å b: 99.943 Å c: 69.991 Å α: 90.00° β: 106.26° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.14 Solvent Content: 42.61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.30 20.00 24235 1274 100.00 0.20593 0.25912 29.389
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 20.0 97.2 0.094 0.110 13.5 3.8 25208 25208 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.3 2.4 95.2 ? 0.324 3.7 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.54000 ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
CrystalClear data collection .
XDS data reduction .
XSCALE data scaling .
MOLREP phasing .