X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295 0.1M HEPES, 0.25M Sodium chloride, 25% (w/v) PEG 4000, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 83.433 Å b: 94.839 Å c: 94.591 Å α: 99.69° β: 97.90° γ: 116.13°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS THROUGHOUT 1.80 25.00 213579 11269 97.36 0.16873 0.20754 27.265
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 30.0 97.4 0.062 ? 18.6 3.5 224520 224520 ? -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.86 94.2 ? ? 3.0 3.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 5ID-B 1.0000 APS 5ID-B
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
MAR345 data collection CCD
HKL-2000 data reduction .
HKL-2000 data scaling .
SHARP phasing .