X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.9 291 0.1M sodium acetate, 30-33 % PEG 1000, pH 4.9, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 58.385 Å b: 73.085 Å c: 83.567 Å α: 79.79° β: 69.61° γ: 88.25°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.37 Solvent Content: 48.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.400 42.835 227962 11453 90.850 0.129 0.166 18.810
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 43 90.8 0.084 ? 13.25 7.0 227962 227962 0 -3 20.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.4 1.5 53.7 ? ? 2.65 2.66 25215
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.99989 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement (phenix.refine)
MAR345 data collection .
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
BUCCANEER phasing .
ARP/wARP model building .
RESOLVE phasing .