X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 293 NANODROP, 20.0% 2-propanol, 20.0% PEG 4000, 0.1M Citric acid pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 57.085 Å b: 58.121 Å c: 140.462 Å α: 80.930° β: 78.430° γ: 60.600°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 47.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.750 29.348 126808 6400 81.570 0.154 0.194 16.810
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 29.348 81.700 0.042 0.042 11.900 1.900 ? 126809 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.80 37.80 ? 0.456 1.5 1.90 4345
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 1.0000, 0.9796 ALS 8.2.1
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
PHENIX refinement .
SOLVE phasing .
MolProbity model building 3beta29
SCALA data scaling .
PDB_EXTRACT data extraction 3.000
ADSC data collection Quantum
MOSFLM data reduction .