X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 277 0.1M NaK phosphate, 20% PEG 1000, 0.2M NaCl, 4mM TCEP, 0.1mM Flavopiridol , pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 173.922 Å b: 173.922 Å c: 97.173 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3
Crystal Properties:
Matthew's Coefficient: 4.15 Solvent Content: 70.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.800 36.96 26956 2699 99.550 ? 0.228 89.790
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.80 38.378 99.8 0.093 0.093 5.000 5.700 26960 26960 1.0 1.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.80 2.95 100.00 ? 0.585 1.2 5.80 3943
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9765 ESRF ID14-4
Software
Software Name Purpose Version
ProDC data collection .
PHASES phasing .
PHENIX refinement .
MOSFLM data reduction .
SCALA data scaling .