X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 2-4% PEG 4K, 0.02M ammonium sulfate, 0.1M Na-MES, pH5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 97.830 Å b: 117.620 Å c: 230.490 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.62 Solvent Content: 53.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.330 53.750 28236 2801 98.900 0.197 0.220 33.300
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.33 59. 98.7 0.060 ? 30.53 13.5 ? 28236 0.0 0.0 30.300
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.33 2.4 88.5 ? ? 10.22 7.3 2122
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9794 ESRF ID14-4
Software
Software Name Purpose Version
CNS refinement 1.2
PDB_EXTRACT data extraction 3.004
MxCuBE data collection .
XDS data reduction .
XSCALE data scaling .
SHELX phasing .
CNS phasing .
Feedback Form
Name
Email
Institute
Feedback