ISDA

3BJS

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	294	30% PEG 2000 MME, 150mM Potassium bromide pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K

Unit Cell:

a: 274.640 Å b: 274.640 Å c: 274.640 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: F 4 3 2

Crystal Properties:

Matthew's Coefficient: 2.31 Solvent Content: 46.74

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	2.70	20.00	23986	795	99.85	0.20701	0.26337	59.227

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.700	50.000	99.2	0.18	0.173	3.9000	7.800	?	24915	?	-0.500	57.55

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.70	2.80	99.2	?	?	1.800	5.30	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		77.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 31-ID	0.9796	APS	31-ID

Software