X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 277 50% PEG 300, 0.2M NaCl, 0.1M Na/KPO4 pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 173.400 Å b: 79.200 Å c: 98.700 Å α: 90.000° β: 104.500° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.44 Solvent Content: 49.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.400 47.78 48113 2575 99.460 0.225 0.275 13.330
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.40 47.78 99.5 0.1157 0.1157 9.77 3.76 50945 50690 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.50 97.6 ? 0.4431 2.69 3.65 5776
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.97649 SLS X10SA
Software
Software Name Purpose Version
PHASER phasing .
DM phasing 6.0
REFMAC refinement .
PDB_EXTRACT data extraction 3.004
CrystalClear data collection .
XDS data reduction .
XDS data scaling .
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