X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|---|---|---|---|---|---|---|---|
| 1 | 100 K | 
| Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|---|---|---|---|
| SYNCHROTRON | NSLS BEAMLINE X12C | 1.1 | NSLS | X12C | 
| Software Name | Purpose | Version | 
|---|---|---|
| REFMAC | refinement | 5.2.0019 | 
| HKL-2000 | data collection | . | 
| d*TREK | data reduction | . | 
| d*TREK | data scaling | . | 
| CCP4 | phasing | 6.0.0 | 
| Coot | model building | 0.1.2 | 
					