X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 15-20% PEG 300, 80-120mM LiSO4 and 0.05% alpha-DDM., pH 7.5, sitting drop vapor diffusion, temperature 277K
Unit Cell:
a: 107.790 Å b: 126.070 Å c: 206.560 Å α: 83.470° β: 76.250° γ: 84.070°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 5.23 Solvent Content: 76.5
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 5.300 19.980 36078 3675 96.800 ? 0.311 308.700
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
5.3 20 96.8 ? 0.046 ? 4.5 36078 36078 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.98 SSRL BL11-1
Software
Software Name Purpose Version
CNS refinement 1.2
PDB_EXTRACT data extraction 3.000
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASES phasing .