X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 300 1.5M NH4Cl, 100mM Bis-Tris, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 300K
Unit Cell:
a: 111 Å b: 111 Å c: 129 Å α: 90° β: 90° γ: 120°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 3.76 Solvent Content: 67.28
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION . THROUGHOUT 1.9 40 23768 2300 97.9 ? 0.228 35.625
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 40 97.9 0.066 ? 18.6 15.3 24277 23768 0 0 30.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 1.97 89.8 ? ? 1.2 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.0809 NSLS X29A
Software
Software Name Purpose Version
CNS refinement .
PDB_EXTRACT data extraction 3.000
HKL-2000 data collection .
HKL-2000 data reduction .
SCALEPACK data scaling .
CNS phasing .