3AYM

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.6 277 3.2M ammonium sulfate, 20mM MES, 75mM EDTA, 10mM beta-mercaptoethanol, pH 6.6, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 122.360 Å b: 122.360 Å c: 158.220 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 62
Crystal Properties:
Matthew's Coefficient: 3.43 Solvent Content: 64.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.80 15.0000 22229 1080 67.7 ? 0.3448 58.7828
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 88.0 95.5 0.078 ? 11.2 3.3 ? 31468 3 0 44.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.8 2.95 95.0 ? ? 2.0 2.8 4562
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW14A 1.0 Photon Factory AR-NW14A
Software
Software Name Purpose Version
MAR345 data collection .
CNS refinement .
MOSFLM data reduction .
SCALA data scaling .
CNS phasing .