X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 295 10 % PEG 3350, 0.1M ADA pH6.2, 0.1M Lithium sulfate, 2% iso-propanol, 5% Acetonitrile , 1mM ATP, 5mM magnessium chloride , VAPOR DIFFUSION, HANGING DROP, temperature 295K
Unit Cell:
a: 86.958 Å b: 147.129 Å c: 175.907 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 3.21 Solvent Content: 61.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.100 29.318 20290 1961 97.37 0.2205 0.2764 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.1 50 99.9 ? ? ? ? ? 20290 0.0 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.1 3.15 100 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 4A 1.0 PAL/PLS 4A
Software
Software Name Purpose Version
HKL-2000 data collection .
PHENIX model building (Phenix.AuroMR)
PHENIX refinement (phenix.refine: 1.6.3_473)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .