X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.4 293 100mM Tris-Cl, 0.5M sodium chloride, 5mM MgCl2, 10% (w/v) polyethylene glycol, pH 8.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 130.848 Å b: 130.848 Å c: 149.639 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 64 2 2
Crystal Properties:
Matthew's Coefficient: 3.86 Solvent Content: 68.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.65 29.97 8777 452 98.9 0.279 0.295 144.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.65 50 98.5 ? 0.09 14.8 4.8 ? 15761 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.65 3.78 92.6 ? 0.326 2.0 3.2 15761
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.9790, 0.97928, 0.98317 Photon Factory BL-17A
Software
Software Name Purpose Version
HKL-2000 data collection .
SHARP phasing .
CNS refinement 1.3
HKL-2000 data reduction .
HKL-2000 data scaling .