X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 30% PEG4000, 0.15M ammonium acetate, 0.1M sodium acetate, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 82.777 Å b: 39.214 Å c: 84.191 Å α: 90.00° β: 117.92° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 36.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.577 28.989 31754 1606 95.600 0.164 0.190 17.780
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.577 28.99 97.8 0.051 ? 22.6 6.7 32428 32428 ? ? 15.43
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.577 1.64 93.0 ? ? 7.90 5.4 3078
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL38B1 0.9792 SPring-8 BL38B1
Software
Software Name Purpose Version
HKL-2000 data collection .
SHELXE model building .
RESOLVE model building .
PHENIX refinement 1.5_2
HKL-2000 data reduction .
HKL-2000 data scaling .
RESOLVE phasing .