ELECTRON MICROSCOPY

Sample

bacterial flagellar hook

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK I
Cryogen Name HELIUM
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles ?
Reported Resolution (Å) 7.1
Resolution Method ?
Other Details a modified version of SPIDER program was used for the reconstruction
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector Type TVIPS TEMCAM-F415 (4k x 4k)
Electron Dose (electrons/Å2) 20
Imaging Experiment
Date of Experiment 2008-02-20
Temprature (Kelvin)
Microscope Model JEOL 3200FSC
Minimum Defocus (nm) 500
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 1.6
Imaging Mode BRIGHT FIELD
Specimen Holder Model JEOL
Nominal Magnification 50000
Calibrated Magnification 89285
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
. each images