X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.00 ? pH 7.00, VAPOR DIFFUSION, HANGING DROP
Unit Cell:
a: 33.380 Å b: 25.330 Å c: 28.110 Å α: 90.00° β: 120.45° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.15
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.900 ? 1108 ? 73.000 0.184 ? 10.70
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.600 ? 73.000 ? 0.014 ? 1.400 1770 1291 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298.00 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ? ? ? ?
Software
Software Name Purpose Version
XENGEN data collection 2.0
XENGEN data reduction 2.0
X-PLOR refinement .
XENGEN data scaling V. 2.0
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