X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 3%w/v Dextrose, 30%w/v PEG 2K MME, 0.1 M KSCN, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 55.765 Å b: 66.012 Å c: 55.623 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.10 Solvent Content: 41.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION isomorphous replacement THROUGHOUT 1.746 33.83 20076 1091 98.60 0.21136 0.25102 32.019
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.746 33.83 99.3 0.062 0.061 45.9 7.3 21489 21339 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.746 1.81 98.0 ? 0.365 2.9 5.8 2043
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.27819 APS 19-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
REFMAC refinement 5.2
HKL-2000 data reduction .
HKL-2000 data scaling .
CCP4 phasing .
Coot model building .
REFMAC phasing .
Feedback Form
Name
Email
Institute
Feedback