X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.2 293 18% PEG-MME 2000, 5mM MgCl2, 0.25mM AlaSA, 100mM Bis-Tris, 0.1mM zinc acetate, pH 7.2, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 160.391 Å b: 49.082 Å c: 98.044 Å α: 90.00° β: 108.08° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.20 46.74 37067 1856 99.2 0.215 0.264 62.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 99.4 0.099 0.099 24.0 7.3 ? 37240 ? -3 40.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.28 95.2 ? 0.509 2.2 6.3 3516
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 95 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.97888, 0.97936 Photon Factory BL-17A
Software
Software Name Purpose Version
CNS refinement 1.2
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SHARP phasing .