ELECTRON MICROSCOPY

Sample

ParM filament

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 2085
Reported Resolution (Å) 23.000
Resolution Method ?
Other Details This data was achieved by negative staining experiments
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GENERIC FILM
Electron Dose (electrons/Å2) 12
Imaging Experiment
Date of Experiment 2007-01-01
Temprature (Kelvin)
Microscope Model JEOL 2010HC
Minimum Defocus (nm) 3700
Maximum Defocus (nm) 10300
Minimum Tilt Angle (degrees) 0
Maximum Tilt Angle (degrees) 0
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 40000
Calibrated Magnification ?
Source LAB6
Acceleration Voltage (kV) 100
Imaging Details ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
. Phase and Amplitude