X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 12~15% (w/v) PEG 1500, 2.0~2.6M NaCl, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 61.78 Å b: 50.70 Å c: 63.34 Å α: 90° β: 97.09° γ: 90°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.09 Solvent Content: 41.24
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.33 30 73703 3753 82.5 ? 0.223 23.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.33 30 98.0 0.054 ? 26 3.7 89322 86594 0.0 1 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.33 1.38 89.5 ? ? 2.9 2.7 8761
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSRRC BEAMLINE BL13B1 0.9796, 0.9641 NSRRC BL13B1
Software
Software Name Purpose Version
HKL-2000 data collection .
SOLVE phasing .
CNS refinement 1.1
HKL-2000 data reduction .
HKL-2000 data scaling .
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