X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 285 30% PEG4000, 0.1M Tris-HCl, 0.2M sodium acetate, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 285K
Unit Cell:
a: 77.047 Å b: 80.521 Å c: 86.881 Å α: 76.23° β: 68.88° γ: 63.46°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.4 20 67758 6747 98.5 0.240 0.247 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 89.6 0.054 ? 14.7 2.0 86460 86460 0 3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.28 84.4 ? ? 30.2 ? 8455
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 1.0 Photon Factory AR-NW12A
Software
Software Name Purpose Version
HKL-2000 data collection .
MOLREP phasing .
CNS refinement 1.0
HKL-2000 data reduction .
SCALEPACK data scaling .