X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 ? 50MM ADA PH6.5, 200MM NALISO4, 10% (W/V) PEG4000
Unit Cell:
a: 105.502 Å b: 266.147 Å c: 110.851 Å α: 90.00° β: 109.52° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.99 Solvent Content: 69.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.30 19.97 84276 4267 98.2 0.243 0.265 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.30 133.07 88.3 0.05 ? 11.08 3.5 ? 140127 ? 2.0 103.02
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.38 10.09 78.3 ? 1.90 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA ? SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE: 1.7_650)
XDS data reduction .
XDS data scaling .
PHENIX phasing .
Feedback Form
Name
Email
Institute
Feedback