X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 ? SEE PAPER, pH 7
Unit Cell:
a: 55.179 Å b: 55.386 Å c: 119.906 Å α: 81.17° β: 91.76° γ: 64.74°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.6 Solvent Content: 53
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.50 35.29 39700 1909 90.9 0.225 0.256 75.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 49.60 90.6 0.07 ? 9.70 1.8 ? 42048 ? 0.0 44.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.66 85.6 ? 2.90 1.9
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX14.1 ? SRS PX14.1
Software
Software Name Purpose Version
CNS refinement 1.2
MOSFLM data reduction .
SCALA data scaling .
CNS phasing .