ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.5	?	HEXAGONAL CRYSTALS WERE GROWN BY HANGING DROP VAPOR DIFFUSION USING 1 MICROLITER PREMIXED GALPHA I1 AND GOLOCO PEPTIDE (1:1.5 MOLAR RATIO) AT 12 MG/ML IN BUFFER (10 MM TRIS PH 7.5, 1 MM MAGNESIUM CHLORIDE, 10 MICROMOLAR GDP, 5 MM DTT) AND 1 MICROLITER CRYSTALLIZATION SOLUTION (800 MM AMMONIUM SULFATE, 200 MM K/NA TARTRATE, 100 MM SODIUM CITRATE PH 5.5).

Unit Cell:

a: 265.261 Å b: 265.261 Å c: 265.261 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 2 3

Crystal Properties:

Matthew's Coefficient: 9.3 Solvent Content: 86.78

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	3.41	39.99	40893	1489	99.83	0.22335	0.24434	108.9

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.41	40.00	100.0	0.12	?	22.10	11.1	?	42418	?	-3.0	99.9

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.41	3.42	100.0		?	2.20	11.1

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 22-ID	?	APS	22-ID

Software