X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 ? 0.1 M HEPES PH 7.0, 1 M SUCCINIC ACID PH 7.0, 1% W/V PEG 2000 MME, 5% 2-PROPANOL
Unit Cell:
a: 187.120 Å b: 187.120 Å c: 187.120 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 41 3 2
Crystal Properties:
Matthew's Coefficient: 3.1 Solvent Content: 60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION OTHER THROUGHOUT 2.10 107.83 16075 856 100.00 0.14531 0.17235 17.370
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 60.00 100.0 0.16 ? 17.30 13.8 ? 16952 ? 2.0 16.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.21 100.0 ? 5.80 14.1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X12 ? EMBL/DESY, HAMBURG X12
Software
Software Name Purpose Version
REFMAC refinement 5.4.0078
MOSFLM data reduction .
SCALA data scaling .
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