ELECTRON MICROSCOPY

Sample

60S-EIF6 COMPLEX

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ETHANE
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles ?
Reported Resolution (Å) 11.8
Resolution Method ?
Other Details SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-1705.
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details METHOD--FLEX-EM
Data Acquisition
Detector Type KODAK SO-163 FILM
Electron Dose (electrons/Å2) 20
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TECNAI F30
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.26
Imaging Mode BRIGHT FIELD
Specimen Holder Model .
Nominal Magnification 39000
Calibrated Magnification 38900
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
? DEFOCUS GROUP VOLUMES
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