X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 ? 2UL SYNDAPIN-I/EHD-1(401 -534)(25MG/ML IN 50MM HEPES,200MM NACL) MIXED WITH WELL SOLUTION 0.1M SODIUM CITRATE BUFFER (PH5.5),0.2M NAAC,10%(W/V) PEG4000. ONLY F-BAR DOMAIN OF SYDAPIN I CRYSTALLIZED.
Unit Cell:
a: 85.060 Å b: 153.490 Å c: 213.290 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 3.1 Solvent Content: 60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.45 76.70 47811 2448 100.00 0.21402 0.26026 32.690
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 76.75 97.2 0.08 ? 16.35 6.69 ? 50261 ? -3.0 55.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.45 2.55 81.8 ? 1.84 3.96
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 ? BESSY 14.1
Software
Software Name Purpose Version
REFMAC refinement 5.3.0040
XDS data reduction .
XDS data scaling .
XPREP phasing .
SHELXD phasing .
SHELXE phasing .