X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 ? HANGING DROP VAPOR DIFFUSION IN 0.1M TRIS PH 8.5, 25% PEG 3350, 200MM NACL, 25-35% NAF USING A DROP SIZE OF 2-10 MICROL AND A RESERVOIR VOLUME OF 750 MICROL. CRYSTALS GREW IN 4-5 DAYS AT EITHER 17C OR 20C.
Unit Cell:
a: 43.610 Å b: 81.020 Å c: 181.540 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.04 Solvent Content: 39.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 2.00 30.00 44405 899 99.8 0.185 0.230 16.80
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 30.000 99.8 0.07000 ? 21.4000 7.160 ? 44405 ? -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.05 99.6 ? 11.700 7.25
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID ? APS 22-ID
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
SHARPD phasing .
DM phasing .
CNS refinement 1.1