ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.0	?	26% (W/V) POLYETHYLENEGLYCOL 4000, 0.1 M 2-(N-MORPHOLINO)ETHANESULFONIC ACID-SODIUM HYDROXIDE PH 5.0

Unit Cell:

a: 157.850 Å b: 157.850 Å c: 99.780 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 41

Crystal Properties:

Matthew's Coefficient: 3 Solvent Content: 59

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.95	20.00	24653	1198	100.0	0.20742	0.23555	52.234

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.95	31.00	99.9	0.10	?	?	6.5	?	25927	?	0.0	74.9

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.95	3.11	99.9		?	?	6.5

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	EMBL/DESY, HAMBURG BEAMLINE X11	?	EMBL/DESY, HAMBURG	X11

Software