X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.4 ? 0.1M NAC2H3O2 PH=4.4 35-40% SATURATED (NH4)2SO4
Unit Cell:
a: 96.330 Å b: 46.270 Å c: 64.590 Å α: 90.00° β: 115.10° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 36.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION DIFFERENCE FOURIER METHOD ? 1.25 40.0 55829 ? 78. 0.149 0.19 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.25 40.0 82.22 0.0595 ? 41.28 3.47 ? 58629 ? 0.0 10.427
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.25 1.29 40.47 ? 5.18 2.05
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE OTHER ? ? ?
Software
Software Name Purpose Version
XENGEN data collection .
XENGEN data reduction .
X-PLOR model building .
TNT refinement .
X-PLOR refinement .
XENGEN data scaling .
X-PLOR phasing .