X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? 100 MM TRIS-HCL (PH 8.4), 100-160 MM MGCL2, 12-17% PEG400
Unit Cell:
a: 111.430 Å b: 114.410 Å c: 270.550 Å α: 94.44° β: 85.92° γ: 102.55°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 4.05 Solvent Content: 69.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 3.29 49.37 347936 7005 88.1 0.228 0.244 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.29 49.36 94.6 0.07 ? 9.90 3.4 ? 186840 ? -3.0 98.09
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.29 3.47 91.2 ? 2.20 3.4
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA ? SLS X06SA
Software
Software Name Purpose Version
XDS data reduction .
SCALA data scaling .
SHELXD phasing .
SHARP phasing .
PHENIX refinement .