X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 ? 20% PEG 6000, 0.1M BICINE PH9.0
Unit Cell:
a: 48.704 Å b: 93.847 Å c: 99.720 Å α: 80.07° β: 80.18° γ: 84.81°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.64 Solvent Content: 53.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.35 95.00 65520 3312 91.8 0.234 0.263 40.61
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.35 95.00 91.3 0.04 ? 14.20 2.0 ? 64754 ? 1.0 50.27
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.35 2.41 80.9 ? 3.10 2.0
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 ? ESRF ID14-4
Software
Software Name Purpose Version
SOLOMON model building .
xia2 data reduction WITH XDS
xia2 data scaling WITH SCALA
BUSTER-TNT phasing .
PHASER phasing .
SHARP phasing .
SOLOMON phasing .
DM phasing .