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X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 ? 70 MM NACL,1.35 MM KCL, 2.1 MM NA2HPO4, 0.75 MM KH2PO4, PH 7.4, 5 MM GLYCEROL, 0.5 MM EDTA, 0.5 MM DTT, 2.5 MM 2-MERCHAPTOETHANOL, 0.05% NONIDET P-40, 2.5 MM CACL2, 2.5 MM DATP, 11% PEG5000MME, 0.1 M AMMONIUM ACETATE,10 MM MES PH 6.5
Unit Cell:
a: 167.829 Å b: 220.847 Å c: 119.208 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 4.4 Solvent Content: 75.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.71 44.65 23026 1113 96.9 0.236 0.273 95.50
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.71 44.65 96.9 0.15 ? 10.40 5.4 ? 23041 ? 0.0 62.50
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.70 3.93 86.4 ? 2.90 5.5
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F ? APS 21-ID-F
Software
Software Name Purpose Version
CNS refinement 1.2
XDS data reduction .
XDS data scaling .
PHASER phasing .
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